Used LEICA / VISTEC INM 100 #293652299 for sale

LEICA / VISTEC INM 100 is a multi-purpose inverted microscope engineered for advanced imaging and specimen observation. At its core, the equipment features a Upright Base, Image and Digital Capture Module, 10:1 zoom lens, and manual XY sample stage. The Upright Base provides an ultra-stable platform for the rest of the system's components, and features long travel drives, numeric illumination control, and aluminum chassis construction with a vibration damping support. The Image and Digital Capture Module provides a range of light source/wavelength choices, providing variable polarization and light control, shutter and integration control, and includes an ergonomic camera arm with a grounded power and control outlet. The 10:1 zoom lens offers easy focus and magnification control and provides a range of 0.65-6.5x magnification, while the large manual XY sample stage provides wide range of movement with precision eucentric drive. The image quality afforded by LEICA INM 100 is precisely oriented for ease of use and accuracy in demonstrating visual specimens. Sensor resolution is up to 12 megapixels, and optical resolution is up to 1024 x 768 pixels. The unit also supports a wide range of digital imaging options with tiled, live and extended views, as well as full spectral imaging with automated spectral capture and analysis. VISTEC INM 100 also supports a wide range of accessories, including temperature control stages, tilting stages and dichroic cubes, as well as TIRF, DIC and confocal setup modules for more advanced observations. The machine also supports simple operation with intuitive touchscreen interface and automated calibration functions. Overall, INM 100 is an efficient, reliable, and cost-effective microscope tool ideal for educational, research, and industrial applications. Capable of providing high accuracy imaging, multiple light source and wavelength choices, and a wide range of digital imaging options, LEICA / VISTEC INM 100 presents a suite of features designed to facilitate accurate specimen observation.