Used LEICA / VISTEC INM 100 #9266899 for sale

LEICA / VISTEC INM 100 is a state-of-the-art, advanced optical microscope. It is a cathodoluminescence based imaging system which selectively detects and illuminates its sample materials to reveal detailed features which can be modeled and observed over a long period of time. LEICA INM 100 offers its users high resolution, high contrast imaging along with automated tools for easy navigation. The microscope is equipped with a 0.76 numerical aperture condenser, providing an excellent level of depth and detail over a wide field of view. VISTEC INM 100 features an automated manual alignment system for quick set up of various imaging parameters. It also has an intelligent light path control system which allows for rapid switching between observation and imaging modes. A user-friendly intuitive software interface is featured for easy operation; it has a tool bar for analyzing data and features like autofocus, magnifying, and auto-illumination of the sample area. INM 100 is engineered with a dual source viewing optics and variable imaging modes, allowing for fast scan rates and data acquisition times. Its large sample area can accommodate up to 15mm objects for observation, and the microscope is capable of automatically focusing on a sample area for high resolution imaging. LEICA / VISTEC INM 100 also boasts of darkfield imaging capabilities with a bright field condenser. This feature creates an intriguing contrast between the bright and dark parts of the sample. Furthermore, it includes the ability to select different optical parameters such as pixel size, background radiation and intensity control, allowing users to fine-tune their imaging requirements. LEICA INM 100 is clearly an advanced microscope, providing excellent imaging capabilities, fast data acquisition times, and automated navigation. It has a large sample area and various features like dark field imaging, autofocus, magnifying, auto-illumination, and optical parameters selection, making it perfect for detailed observation and analysis in a wide range of applications.