Used NIKON NEXIV VMR-3020 #293618900 for sale

NIKON NEXIV VMR-3020
Manufacturer
NIKON
Model
NEXIV VMR-3020
ID: 293618900
Measuring microscope.
NIKON NEXIV VMR-3020 is an advanced microscope that provides analyses of a wide range of sample sizes and substrates. This automated microscope is capable of producing high-resolution images for a variety of industrial and scientific applications. NEXIV VMR-3020 utilizes a high-performance motorized zoom system with a maximum zoom ratio of 250x. This allows for the observation of objects as small as 100nm. The microscope offers a wide range of objective lenses, including high-resolution optics, to provide a greater resolution of images. The microscope also provides a full range of analytical capabilities, including an overhead of up to 50x. NIKON NEXIV VMR-3020 features a 45° inclined viewing surface and a large observation area of 16x12x4cm for easy access to samples. The large field of view also ensures a comfortable, ergonomic view of the sample. The microscope also includes a fine focus adjustment knob with a large control range, allowing for precise adjustment of the focus and magnification. NEXIV VMR-3020 supports use of reflected and transmitted illumination, providing high contrast images of both specimen and fine structures. The microscope is also compatible with several types of cameras, including CCD, DSLR, and other digital imaging cameras, allowing for the capture and analysis of images in a wide range of conditions. NIKON NEXIV VMR-3020 offers software controls and a robust operational environment. The microscope utilizes an intuitive user interface and a range of imaging functions, enabling the user to easily configure, analyze and control the microscope. Furthermore, the software provides a range of tools for measuring size, shape, and other microscopic features. Overall, NEXIV VMR-3020 is an advanced microscope that provides powerful features for the observation and analysis of microscopic objects. Its motorized zoom and range of analytical capabilities allow for effective observation and measurement of samples as small as 100 nm. The intuitive user interface and software tools enable the user to quickly and efficiently capture and analyze images.
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