Used PARK SCIENTIFIC INSTRUMENTS AFM #9148943 for sale

PARK SCIENTIFIC INSTRUMENTS AFM (Atomic Force Microscope) is a type of scanning probe microscope, which is specifically designed to produce high-resolution images of the surface of a sample at the atomic level of detail. This type of microscope is unique in its capability to measure and image both soft and hard surfaces and topology. This is accomplished through a combination of an extremely high-resolution optical system and a computer-controlled mechanical probe that is used to explore the sample surface. At the heart of AFM are two primary components: the sensor and the cantilever, both of which are mounted on a rigid platform. The sensor is an ultra-high resolution optical system which is capable of measuring the strength of the high frequency force between the cantilever and the sample surface with nanometer resolution. This force signal is then converted into an optical image and can be used to produce an incredibly detailed, high-resolution three-dimensional image of the sample which is applicable to a wide range of materials. The cantilever is a small beam with an individual tip at one end, typically aligned in a direction perpendicular to the sample surface. The tip is then brought into contact with the sample surface in order to measure the forces between the tip and sample surface atoms and molecules, as well as images of physical features such as grain boundaries. The cantilever is fitted with an adjustable piezoelectric driver which is capable of finely controlling the tip's motion and position. This allows the tip to scan the surface of the sample with a resolution of the order of nanometers, which is far beyond the limit of standard optical microscopes. PARK SCIENTIFIC INSTRUMENTS AFM from PARK SCIENTIFIC INSTRUMENTS boasts superior performance characteristics for imaging, with a number of technology features dedicated to optimizing accuracy and speed. Depending on the model, AFM may have one of many types of sample stages that are designed to accurately measure the position of the sample relative to the cantilever. It may also have a sample scanner, which is a movable assembly that can change the size of the area to be measured by controlling the motion of the sample. PARK SCIENTIFIC INSTRUMENTS AFM is an invaluable tool for scientific and medical researchers as it can be used to study the surfaces of various materials such as semiconductors, polymers, proteins, and cells with exceptional accuracy and detail. It is capable of analyzing structures and properties such as surface topography, roughness, adhesion, and viscoelasticity. Furthermore, it can be used to observe nanometer-scale changes in these properties over time and provide valuable insight into the dynamic behavior of materials.