Used PARK SYSTEMS NX 10 #293667516 for sale

PARK SYSTEMS NX 10 is an atomic force microscope (AFM) designed for high resolution surface imaging to provide the most accurate and reliable data at nanoscale level. This AFM combines powerful topographical imaging with non-contact dynamic imaging to achieve unprecedented performance in nano-scale imaging with its superior structural and mechanical measure ability. NX 10 features an integrated 'Ethernet' system which allows users to control the system remotely via any internet browser on any computer. This also allows control and data exchange between PARK SYSTEMS NX 10 and associated software such as the PARK SCAN-CONTROL and PARK IMAGE SOFTWARE. NX 10 is capable of creating ultra-high resolution images down to the resolution of 0.07 nanometers. This is made possible by its 'Triple-Laser Beam' technology which combines three sophisticated laser beams that are used for image plane, focusing and tracking. Additionally, the optical design features a 'Motorized Z Axis' for sample z-adjustment and an 'Enhanced Dual-Tip Scanner' for faster imaging speed. PARK SYSTEMS NX 10 also has an optimized stage design for unparalleled accuracy and simple calibration. This eliminates the need to 'level the stage', a procedure normally required for AFM imaging. Furthermore, the stage has several automation features including a 'Auto-Deflect' mode which adjusts the tip-sample force, a 'Zero-Drift' mode which prevents the Z-Axis drifting over time due to drift in temperature, and a 'Smart Scan' mode which scans in-sync with the scan speed and measurement settings. NX 10 also includes a range of options such as vibration control, sample holders, and a variety of imaging modes whichall work to improve the accuracy of the data collected. In addition, PARK SYSTEMS NX 10 has an 'Immediate-Mode' imaging function which enables it to produce an image almost instantaneously with just one command, improving workflow efficiency. Ultimately, NX 10 AFM combines advanced imaging technology, improved accuracy, automation and software controls to offer users the most comprehensive solution for nanoscale imaging available today.