Used PARK SYSTEMS XE7 #293657995 for sale

PARK SYSTEMS XE7 is a state-of-the-art scanning probe microscope engineered by PARK SYSTEMS, a leading innovator in the field of microscopy. This microscope combines advanced features and cost-effective performance for superior imaging and analysis of a wide range of surfaces and materials. XE7 offers advanced imaging capabilities such as sub-nanometer resolution, non-contact atomic force microscopy (AFM), and a host of innovative, user-friendly features. Non-contact AFM allows for scanning at the atomic level without making direct contact with the sample, resulting in higher resolution images and faster acquisition time. Additionally, PARK SYSTEMS XE7 utilizes a unique 'Scanasyst' feature, which allows users to quickly switch between topography and nanoscale resolution imaging. This versatility makes XE7 a valuable tool for investigating a wide range of nanoscale and molecular characteristics and surfaces. PARK SYSTEMS XE7 also provides a wide variety of customization possibilities, allowing users to tailor its features to their individual needs. An automated rail-deflection system ensures a uniform image across the entire sample, while automated scan-lock functions enable efficient sample scanning and data-security features protect users' data. Optional forms of control available for XE7 include a remote-controller and a touch-screen monitor with an intuitive graphical interface for easy operation. In addition to its excellent imaging capabilities and features, PARK SYSTEMS XE7 also offers a robust set of software and software packages. The included 'SIMA' software provides users with powerful imaging and analysis capabilities, including features such as 3D profiling and image stitching. These programs allow users to conduct accurate visualizations and characterize samples with data-rich images. Additionally, XE7's Analysis & Reporting software allows users to create graphical reports and presentations to share their data with colleagues. PARK SYSTEMS XE7 by PARK SYSTEMS is a cutting-edge, high-performance scanning probe microscope, perfect for those who need precise imaging capabilities and versatile features. Its robust set of software and customization options makes it ideal for a wide range of applications in materials science, nanotechnology, and other fields.