Used SEMICAPS SOM/PEM 1100 #293777575 for sale
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ID: 293777575
Vintage: 2011
Microscope
PEM 1101 Dark box
MS 100 Upright analytical base system with HR Microscope stage
MM 210 2-Port NIR Microscope and camera with 5-Position angled turret: Dual optical axes
CM 300 InGaAs TE-Cooled camera: 320 x 256
SW 100 CAD Navigation with overlay
Lenses:
NL 10: 1x Macro lens, NA=0.4, WD=46.7 mm
NL 20: 2.5x NIR Lens, NA=0.06, WD=32 mm
NL 30: 5x NIR Lens, NA=0.15, WD=35.1 mm
NL 50: 20x NIR Lens, NA=0.4, WD=22 mm
NL 60: 50x NIR Lens, NA=0.45, WD=18.3 mm
NL 70: 100x NIR Lens, NA=0.55, WD=14.1 mm
Laser options:
LS 100 Laser scanner module
LS 210 Dual laser controller
LS 300 Laser, Wavelength: 1064 nm, Power: 500 mW
LS 310 Laser, Wavelength: 1340 nm, Power: 500 mW
EL 302 Voltage Bias Amplifier (VBA)
2011 vintage.
SEMICAPS SOM/PEM 1100 microscope is an advanced imaging system designed for high-resolution analysis of a wide range of samples in the fields of materials science, life sciences, and semiconductor research. This powerful microscope offers a comprehensive set of features and capabilities that enable researchers to explore and analyze samples with exceptional detail and precision. One of the key features of SEMICAPS SOM/PEM 1100 microscope is its dual-mode operation, which allows users to switch between scanning electron microscopy (SEM) and transmission electron microscopy (TEM) imaging modes. This versatility provides users with a wide range of imaging options to suit their specific research needs. The SEM mode is ideal for surface imaging and elemental analysis of samples, while the TEM mode enables users to examine samples at the atomic level with high resolution. SEMICAPS SOM/PEM 1100 microscope is equipped with a high-performance electron gun, capable of generating a focused electron beam with high brightness and low aberration. This advanced electron source delivers exceptional imaging quality and resolution, allowing users to capture detailed images of samples with superb clarity and contrast. The microscope also features a high-speed scanning system that enables rapid image acquisition and analysis, making it an efficient tool for high-throughput research applications. In addition to its imaging capabilities, SEMICAPS SOM/PEM 1100 microscope is equipped with a range of analytical tools for characterizing samples and studying their properties. The microscope is equipped with energy-dispersive X-ray spectroscopy (EDS) and electron energy loss spectroscopy (EELS) detectors, which enable users to perform elemental analysis and chemical mapping of samples with high sensitivity and precision. These analytical tools provide researchers with valuable insights into the composition and structure of their samples, helping them better understand their materials and processes. SEMICAPS SOM/PEM 1100 microscope is also equipped with advanced imaging and data analysis software that enables users to process and analyze their images with ease. The software allows users to perform image enhancement, image stitching, and 3D reconstruction of samples, enabling them to visualize and analyze their samples in great detail. The microscope also offers image capture and data export functions, allowing users to save and share their results for further analysis and collaboration. Overall, SEMICAPS SOM/PEM 1100 microscope is a versatile and powerful imaging system that offers a wide range of features and capabilities for high-resolution analysis of samples in various research fields. With its dual-mode operation, advanced electron source, analytical tools, and imaging software, this microscope provides researchers with a valuable tool for exploring and understanding the microstructure and properties of materials at the nanoscale level.
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