Used SII NANOTECHNOLOGY / SEIKO / HITACHI L-Trace II #293757979 for sale

Atomic Force Microscope (AFM) Sample stage, 6" Scanning method D/A converter control Maximum voltage: ± 200 V Maximum scan rotation : ±180° Maximum simultaneous measurement: 4 Power: 100 AC, 1.5 A, 50/60 Hz 2012 vintage.