Used SONOSCAN C-SAM D-6000 #9223694 for sale

SONOSCAN C-SAM D-6000 is an advanced semiconductor acoustic microscope designed for an unsurpassed range of acoustic imaging and analysis applications. This equipment offers the latest in acoustic imaging technology, with the highest resolution, and includes several features to provide the highest system performance and finest acoustic imaging data. SONOSCAN C-SAM D6000 uses laser pulse-echo techniques to generate acoustic images of thin film materials on the surfaces of semiconductor wafers. The ultrasonic pulses generated by the laser excitation source are focused on the front and back surfaces of the material and the resulting acoustic signals are acquired and processed. This scan produces a cross-sectional view of the material. C-SAM D-6000 offers exceptional resolution, making it the ideal tool for inspection and analysis of materials on the nanometer scale. It is also capable of monitoring micro-modifications inside the material, such as sub-surface defects, micro electrical components, and buried features. Its advanced hardware and software features also make it ideal for the evaluation of high volume production line samples. Its field of view can be adjusted according to the specimen size, allowing very accurate imaging. C-SAM D6000 is well-suited for the analysis of IC components, MEMS structures, 3D structures, and non-destructive tests on high resolution lithography structures. Additionally, its specialized implementation of cross-sectional imaging techniques can be used to inspect fabricated materials against pre-existing design drawings in order to identify any deviations from the design. SONOSCAN C-SAM D-6000 offers a comprehensive set of software tools, such as its Auto Focus feature, which ensures proper focus in real-time without needing manual adjustment. This unit is also optimized for both pulsed and CW acoustic imaging, offering more flexibility for various applications. In addition to its imaging capabilities, SONOSCAN C-SAM D6000 offers a range of analysis functions. Its advanced signal/noise rejection and pre-scanner features can accurately measure characteristics like layer thickness and profile shape even in the presence of signal contamination. This machine also includes an optimal peak-picking algorithm to identify and characterize features with very low amplitude or high background SNR. C-SAM D-6000 is a highly versatile tool designed to meet the requirements of a wide range of applications in the semiconductor industry. Its accuracy, reliability, and advanced features make it an invaluable tool for the analysis of any type of material.