Used SONOSCAN C-SAM Series D-9000 #9176975 for sale
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ID: 9176975
Vintage: 2001
Acoustic microscope
Reflection mode transducer holder
C-Mode scanning
PC
Missing: T-ARM for THRU Transmission scan
2001 vintage.
SONOSCAN C-SAM Series D-9000 is an advanced scanning acoustic microscope, designed specifically for the purpose of high-resolution acoustic imaging. It utilizes zero-cross and pulse-echo imaging techniques to probe materials and provide detailed acoustic imaging of layered thin films, micro-devices, bulk materials, and even single-crystal specimens at the nanometer-scale. This ultra-high-resolution acoustic imaging microscope is engineered for accurate nondestructive analysis and reliable imaging of materials at the sub-micron level. It utilizes a 256-channel sensor system to accurately and simultaneously measure up to 256 positions within a sample, and provides users with the capability for real-time adjustments in speed and sensitivity. Its maximum probe speed of 4-mm/sec can be reduced to 0.001 um/sec, offering unparalleled accuracy and repeatability. C-SAM Series D-9000 offers superior capabilities when compared to other acoustic imaging microscopes, including the ability to image two different materials simultaneously. Its pulse-echo imaging mode is capable of focal depths up to 2 μm, and its zero-cross mode is maximized at 4μm and beyond. Additionally, its wide rectangular field of view captures up to 32,000 data points in a single frame, and its high dynamic range allows for acoustic measurements to be seen in detail. Furthermore, SONOSCAN C-SAM Series D-9000 comes with robust software features that provide users with easy-to-use tools to quickly build a detailed image of materials for analysis. As an example, its automated image stitching feature creates smooth composite images and removes parallax artifacts. It also has an automated subtraction feature to locate material on multiple layers simultaneously and can measure subsurface vertical heights with a high degree of accuracy. C-SAM Series D-9000 is a robust scanning acoustic microscope that provides users with the necessary tools to accurately and reliably image a variety of materials at the sub-micron level. Its user-friendly software and suite of features make it an ideal choice for a variety of applications, such as materials analysis, defect detection, and nondestructive testing.
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