Used SONOSCAN C-SAM #9138543 for sale

SONOSCAN C-SAM (Confocal Scanning Acoustic Microscopy) is an advanced imaging and measurement technology developed in the 1980s at SONOSCAN, Inc. The tool is used to visualize and measure extremely small acoustic phenomena, such as micro and nanostructures, not visible through optical microscopy. In contrast to normal optical microscopy, SONOSCAN CSAM does not need a light source as the acoustic wave provides the energy necessary for imaging, instead of the laser beam typically used in optical microscopes. It is a non-destructive analysis method which requires minimal sample preparation. C-SAM instrument has two components: a microscopic transducer and a detection equipment. The microscopic transducer generates acoustic waves which are tuned to the resonance frequency of the sample. The transducer also acts as an acoustic lens, allowing the acoustic waves to be transmitted, focused, and collected in a well-defined pattern. The lens is designed to focus the acoustic wave energy on the surface of the sample being examined, allowing the material to be probed in two axes (x and y). When the acoustic wave penetrates the sample surface, it produces a change in the waveform which is then detected by the detection system. The detection unit determines the acoustic properties of the material by measuring the acoustic waveform signature. By measuring the frequency, amplitude, phase and power of the acoustic waveform, the detection machine can determine the acoustic properties of the material which it can then use to produce an image. This image can be viewed either digitally or with an Optical Microscope to compare results and verify the imaging accuracy. CSAM can be used to measure a wide range of material properties, including thickness, porosity, elasticity, thermal acoustic mismatches, acoustic wave propagation, acoustic impedance, surface texture, and sound speed. The acoustic waves generated by SONOSCAN C-SAM tool are also capable of detecting material flaws, such as cracks, voids, and other discontinuities in the material. SONOSCAN CSAM is an invaluable tool for the inspection of a wide range of materials, from polymers to metals, as well as for inspecting and measuring microelectronic components. The asset is capable of providing precise information regarding the material's acoustic properties and can detect flaws not visible through optical microscopy, making it ideal for use in defect analysis, quality control, medical diagnosis, and scientific research applications.