Used SONOSCAN DF2400 #9282984 for sale

SONOSCAN DF2400 is an advanced non-contact microscopic electrical testing instrument. It is designed to provide detailed automated electrical scan testing, analysis and imaging. DF2400 features an optical microscope that is capable of operating at magnifications of up to 1000x with both bright field and dark field illumination. The integrated software provides user-friendly functions for creating detailed electrical test results, enabling rapid testing and diagnosis of structure defects, electrical shorts, opens, shorts to other nodes and pin to pin measurement results. SONOSCAN DF2400 has a proprietary high resolution monochrome imaging equipment which is combined with a proprietary video based design focus system. This combination allows the unit to view and display images in both bright field and dark field modes at resolutions up to 30nm. A built-in LED lighting source provides illumination and a range of filters enable the user to adjust the light intensity to suit their application. The machine is capable of acquiring electrical measurements of components at up to six channels concurrently using a range of technologies such as conductive atomic force microscopy (CAFM), thin film leakage current (TFLC) measurements and electrostatic voltage contrast (EVC). These technologies enable the tool to detect defects such as shorts, opens, corner cracking, voids, thin die and etc. DF2400 also includes a wide variety of PC-based analysis and reporting functions, enabling the user to create meaningful analysis and reports on the data collected. All of the electrical testing, imaging, analysis and reporting functions are ergonomically designed and user friendly. SONOSCAN DF2400 is an advanced and highly reliable asset designed to provide automated electrical scan testing, analysis and imaging solutions. This model is useful for testing a wide variety of integrated circuit devices and provides a wide range of analysis and reporting functions enabling the user to rapidly and accurately diagnose the structure and electrical issues in their test samples.