Used SONOSCAN ECHO-LS #9316346 for sale
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ID: 9316346
Scanning Acoustic Microscope (SAM)
Low-end PC
Pulse 2L
Pulse 2H
Primary tank filter system
C1 Plate
Baffle plate
Options:
Wafer jig, 12"
ICEBERG
TAMI
SDI
MFCI
PETT Kit
Dual monitors
FC Scan
Pulse 2U
Pedestal
2nd Tray fixture
Through transmission
Flexible tray fixture
Transducer ID (RFID)
Extended wand fixture
Dual monitors
Joystick
Waveform simulator
Beam emulator
Waveform averaging
Warped wafer chuck
Contour following
Power supply: 110-220 V.
SONOSCAN ECHO-LS is a scanning acoustic microscope platform that combines full-field imaging capabilities with automated measurements in a single device. This microscope uses focused ultrasound (US) pulses to scan a sample, and scans the sample from multiple directions to construct a 3-dimensional image. It is ideal for identifying the presence of any defects like cracks, voids and other types of discontinuities in locations that can't be seen with conventional optical microscopes. Due to its unique acoustic microscopy technology, SONOSCAN can offer fast scanning times, unmatched imaging accuracy, and a greater transparency of image contrast than any other inspection procedure. This microscope is designed for a variety of applications such as the inspection of through-silicon vias (TSV) and wafer-level packaging (WLP) products, package-on-package (PoP) and ultra-large-scale integrated (ULSI) circuit devices, and many others. In terms of operational performance, ECHO-LS microscope comes with a wide array of features. It has an overall operating frequency of 10MHz to 500MHz, with a single-pass scanning speed of up to 10µ m/s. It can provide resolutions of up to 0.7µ m across its entire range of operating frequencies. Its depth of view is up to 3mm and its field of view is up to 1mm. Automatic software functions and scan parameters can be configured to offer an optimal set of high resolution images and 3D models of a sample. SONOSCAN ECHO-LS microscope is a highly versatile, reliable and accurate inspection solution for any package or product defect or contour measurement. Its advanced design and features make it an excellent choice for any demanding inspection application.
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