Used VEECO / DEKTAK Dimension 3100 #9302575 for sale

VEECO / DEKTAK Dimension 3100
ID: 9302575
Atomic Force Microscope (AFM).
VEECO / DEKTAK Dimension 3100 is a multicomponent scanning probe microscope (SPM) equipment developed to provide high-resolution topographic, mechanical and electrical characterization of sample surfaces. It has an exceptionally stable scanning platform with an active feedback system and is widely used in a range of research and industrial applications including materials science, nanoscience, semiconductor devices, and MEMS, as well as for nanometrology and tribology. VEECO Dimension 3100 includes a range of hardware components designed to measure and analyze samples. The major components are the scanning head, the stage, the display, and the controller. The scanning head is a high resolution, high speed XYZ scanner mounted on a precision positioner. It can image and move sample surfaces at nanometer scale increments with resolutions down to 0.3 nm. The stage is a motorized platform which moves the sample relative to the XYZ scanner as the scanning head makes measurements. The display is a powerful graphical user interface which displays the sample surface at up to 50 nm/pixel resolution, in a variety of modes - including real time and qualitative images. The display also allows users to control the scanning parameters, such as scan speed, display gain, size and speed of the scanning window, and different characteristics (such as surface area, roughness, and continuity). DEKTAK Dimension 3100 also features additional mechanical and electrical components, such as force and electrical sensors, which allow for non-destructive mechanical and electrical characterization of samples. The force sensors can measure the hardness, stiffness, and frictional properties of samples, and the electrical sensors measure surface resistivity, data transfer and other properties. Finally, the controller is a PC-based unit interfacing with the hardware components of Dimension 3100. It includes several pre-programmed control algorithms and is capable of complex multi-parameter scanning. The controller also allows for the analysis and real-time data display of measurement results from the machine. Overall, VEECO / DEKTAK Dimension 3100 provides an exceptional combination of precision, accuracy, and versatility for a wide range of imaging and material characterization tasks. The tool's hardware and software components work together to deliver top quality results with ease of use and reliability.
There are no reviews yet