Used VEECO / DEKTAK Dimension 3100 #9386222 for sale

VEECO / DEKTAK Dimension 3100 is a versatile scanning capacitance microscope perfect for performing detailed measurements of surface properties. The equipment design consists of a VEECO Dimension 3100 main unit, a Data Station with V7 software and a motorized stage. It offers a vertical measurement range of 30 microns and is capable of scanning areas up to 35 mm in size at speeds of up to 400 microns/sec, reducing data collection time considerably. DEKTAK Dimension 3100's large area scanning capabilities allow for analyzing multiple structures simultaneously in one scan. Dimension 3100 is equipped with an integrated autoloader to allow for multiple sample measurements to be taken, without the need for constant operator presence. The system also includes an integrated Quality Control Manager (QCM) which uses predictive analysis based on scan data to ensure consistent and reliable measurements. The integrated capacitance measuring head is also highly adjustable with the capability to measure 14 different film thickness calibrations from 0,02 to 500 nm. VEECO / DEKTAK Dimension 3100 is capable of performing a variety of surface analysis techniques such as topography measurement, adhesive/opaque thickness measurement, film stress measurement, and etching profiling. The unit can also measure profiles such as step heights, hole diameters, spaces and coating thicknesses, eliminating the need for multiple instruments in one laboratory setup. Other features include the integrated LithoScope software which is used for step height analysis as well as interactive analysis and virtual metrology. The machine integrates with various software applications such as 3D Sculptor, Explorer Kit, and Image Editor. The integrated "Align and Trace" feature also allows users to draw circles, lines and curves to measure sample features. VEECO Dimension 3100 is a high-performance scanning capacitance microscope optimized for a variety of laboratories and surface analysis techniques. With its large measurement area and integrated features, it is perfect for measuring and analyzing multiple structures and films simultaneously for accurate and reliable results.