Used VEECO / DEKTAK Dimension X3D #9298810 for sale

VEECO / DEKTAK Dimension X3D microscope is a high resolution scanning probe microscope (SPM) equipment designed for measuring surface topography on a microscopic scale. It is used to measure and analyze surface profiles with nanometer resolution. VEECO Dimension X3D is composed of four essential components: the SPM head, which houses the mechanism for creating and detecting the tip-sample interaction; a drive and controller unit; a microscope, which includes the imaging and optical components; and a computer system, which is used for controlling and data analysis. The SPM head can scan samples in any direction in three dimensions with speeds up to 2000 nm/sec. A vacuum chuck holds the sample in place, and either XY or XYZ stages can be employed for precise sample positioning at the micron and nanometer level. Using the correct probes and cantilever tips, DEKTAK Dimension X3D is capable of performing a variety of surface imaging modes, such as contact mode and non-contact mode. In contact mode (also called a 'force mode'), an interaction force is generated by a sharp tip (usually a silicon AFM probe) that is scanned over the sample's surface. Non-Contact Mode Imaging (also called 'tapping mode') is accomplished by the oscillatory motion (tapping) of the cantilever tip over the sample surface, creating a non-destructive, low force interaction. Dimension X3D microscope is complete with high-performance software for data acquisition and analysis. It features edge detection and surface imaging capabilities that allow users to accurately measure surface features. Additionally, the unit has the ability to measure the contact/non-contact mode motion and force curves. VEECO / DEKTAK Dimension X3D machine is an uptime workhorse, allowing for long, uninterrupted imaging times without overheating. It is designed to be intuitive to use and can be quickly put into action with a few quick steps. Overall, VEECO Dimension X3D is an excellent option for researchers who need a reliable and accurate SPM tool to measure nanometer scale surface topography. With its relative ease of use and excellent imaging capabilities, it is an ideal choice for any application requiring the observation of materials on the nanoscale.