Used VEECO / DIGITAL INSTRUMENTS CP-II CP 0100 #9233894 for sale

VEECO / DIGITAL INSTRUMENTS CP-II CP 0100 is a advanced research microscope designed for Atomic Force Microscopy (AFM) and scanning tunneling microscopy (STM). VEECO CP-II CP 0100 has a fast scan speed of up to 25Hz, allowing researchers to scan material samples quickly and accurately. DIGITAL INSTRUMENTS CP-II CP 0100 features a closed-loop scanning and feedback equipment. This system monitors the position of the scan head to ensure precise movements, even at the fastest scan speed. The microscope is equipped with a sample holder that can be locked in place for repeated measurements, offering improved consistency in analysis. CP-II CP 0100 features a large conjugate objective lens, which allows the microscope to acquire high-resolution images and accurately measure samples. The microscope also has a proprietary 'data-bank' which allows users to store, recall, and compare data quickly and accurately between different sets of samples. This microscope is equipped with a state-of-the-art electronics package. It has high power and low noise amplifiers, for excellent signal to noise ratios. It is also equipped with a wide range of transducers which allow the user to accurately acquire data taking into account a range of parameters, such as temperature, humidity, and electrical current. VEECO / DIGITAL INSTRUMENTS CP-II CP 0100 has an elegant user interface which allows users to easily select the required settings. The interface also displays detailed information about the measurements obtained from the samples, such as topographic images, force spectroscopy curves, and spectra. The microscope is built on a rigid yet lightweight frame which offers excellent stability for long and accurate scanning operations. The microscope has a built in XY scanning unit and a vacuum chamber which helps to protect the sample from atmospheric effects, thereby allowing precise measurements even in the most challenging conditions. In summary, VEECO CP-II CP 0100 is an advanced research microscope, designed for Atomic Force Microscopy (AFM) and Scanning Tunneling Microscopy (STM). It offers fast scan speeds of up to 25 Hz and has a high-resolution conjugate objective lens. It features a closed-loop feedback machine, a data-bank for information storage, a range of transducers, and an elegant user-interface. This microscope is suitable for research in a wide range of applications.