Used VEECO / DIGITAL INSTRUMENTS D3100S-1 #293698975 for sale

ID: 293698975
Wafer Size: 8"
Atomic Force Microscope (AFM), 8".
VEECO / DIGITAL INSTRUMENTS D3100S-1 is a powerful scanning semiconductor microscopy equipment designed to meet the needs of semiconductor device designers and manufacturers. It features high-resolution imaging and measurement capabilities ideal for studying the structure of semiconductor devices, and can be used to observe and analyze surface morphologies, small features, defects, and packaging. The system features an integrated, arm-mounted wafer stage, a high-resolution optical imaging unit, VEECO patented FocusLock™ feature, and control software for easy, intuitive operation. The machine consists of a silicon-on-insulator-bonded, optically transparent, stainless steel wafer stage mounted on the microscope's arm, and a high-power, high-resolution, episcopic imaging tool. The wafer stage allows for movement in three dimensions and rotates and tilts to ensure ideal surface alignment. The stage is capable of carrying substrates up to 25mm in diameter and up to 13mm in thickness. The episcopic imaging asset uses state-of-the-art optics which provide an excellent balance of resolution, speed and light throughput. This model provides up to 500x magnification, high-resolution imaging and precise measurements of microscopic components. An additional fiber-optic light source allows for full-field illumination to be adjusted for improved contrast. The FocusLock™ feature meets the need for higher speed, higher accuracy auto-focusing. This feature monitors the focus of the lens in real time and adjusts it when necessary for optimum image sharpness. VEECO D3100S-1 provides improved imaging accuracy and reliability as well as faster auto-focusing. The equipment is controlled by a straightforward, easy-to-use software. It enables imaging of samples from the wafer platform, with full control of focusing, magnification, and image adjustment tools. The software also collects data for further analysis, allowing the user to study the images in detail. In conclusion, DIGITAL INSTRUMENTS D3100S-1 is an advanced scanning semiconductor microscopy system designed to meet the needs of semiconductor device designers and manufacturers. It features high-resolution imaging and measurement capabilities ideal for studying the structure of devices, and has an intuitive control software that simplifies the process of studying the images. The FocusLock™ feature allows for faster auto-focus and improved imaging accuracy and reliability.
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