Used VEECO / DIGITAL INSTRUMENTS D3100V #9292569 for sale

VEECO / DIGITAL INSTRUMENTS D3100V series Scanning Probe Microscope (SPM) is a state-of-the-art imaging and measurement system designed to deliver enhanced measurements in both topography and geometry. This series allows for characterization of materials, surfaces, and interfaces up to a nanometer resolution. It features a sensitive contact mode that allows measurements to be taken with stable force for accurate imaging. VEECO D3100V series allows for study of topography and geometry through the high-resolution 3D imaging, variable working distances, and a variety of interchangeable probes including the standard sharpened tip and various silicon tips. DIGITAL INSTRUMENTS D3100V series features an edge-on view optical microscope, an auto-focus mechanism, and an integrated laser system with a HeNe laser or the 532nm argon laser. This series is aslo equipped with piezo stage allowing for higher angular resolution and lower laser interference. D3100V series includes intuitive software that sends commands to the SPM to perform vertical, uniform sampling with a force sensing stylus. It offers a variety of advanced features such a AutoView that automatically synchronizes the drive mirror, piezoscale, optical zoom, and optical focus to maintain alignment between all parts of the optical train. Further, it includes a virtual stylus which enables the user to capture topography images with repeatable precision. Other features include a programmable waveform generator allowing for dynamic manipulation of the tip. This helps to accurately measure the surfaces and increase flexibility of its measurement capabilities. The auto scan field alignment feature automatically nstalls the sample and pointer, resulting in precise imaging. Also, with the colorgraphic 3D surface display, users can visualize hard to measure surface structures and features. Overall, VEECO / DIGITAL INSTRUMENTS D3100V series Scanning Probe Microscope offers enhanced imaging capabilities with features such as auto-focus, variable working distances, interchangeable probes, intuitive software, and programmable waveforms that help to capture accurate and repeatable measurements. It is designed to accurately measure material, surfaces, and interfaces up to a nanometer resolution.