Used VEECO / DIGITAL INSTRUMENTS Dimension 3000 #9300087 for sale

ID: 9300087
Wafer Size: 6"
Atomic Force Microscope (AFM), 6" Nanoscope III A Controller Vacuum chuck, 6" XY Stage with manual positioning Computer Operating system: Windows (2) Flat panel monitors TMC Isolation table and enclosure Operations manual and documentation.
VEECO / DIGITAL INSTRUMENTS Dimension 3000 is a world class scanning electron microscope (SEM) designed for research in the fields of materials characterization and nanotechnology. It offers advanced technology for advanced imaging and the most accurate measurements in its class. VEECO Dimension 3000 features an improved optical design, which includes an Integrated Analytical Mode for higher resolution images. It also features a state-of-the art sensor equipment and the latest Vacuum Test System for monitoring the quality of the vacuum state. The SEM is equipped with a high-powered electron gun and multiple sample stages for greater versatility. It is also capable of variable pressure operation for studying liquids and biological materials. The integrated electron-optical column features a patented liquid lens vacuum-test unit for maximum electron detector performance. Also included is the unique Peltier focus drive, which is capable of providing sub-micron accuracy. The patented Bias Network Technology provides high image contrast with minimal beam distortion. Additionally, DIGITAL INSTRUMENTS Dimension 3000 offers extra long image acquisition times and accurate measurements of small features over a wide range of magnifications. Dimension 3000's efficient design and control machine allows for user-defined settings and greater flexibility. The control tool includes variable electron beam settings, beam current ranges, and image and layer settings. Users can customize the color balance and contrast in a way that best suits their application. The control asset also features 3D mapping of the surface and specimen. The SEM is well suited for use in research and industries that require characterization of materials and devices. It is ideal for electron microscopy, metallography, material research, nanotechnology, semiconductor processes and failure analysis. The SEM boasts excellent imaging, precise measurements, and unrivaled performance.
There are no reviews yet