Used VEECO / DIGITAL INSTRUMENTS Dimension 3100 S-1 #293629513 for sale

VEECO / DIGITAL INSTRUMENTS Dimension 3100 S-1 microscope from VEECO is a versatile, dual-mode atomic force microscopy (AFM) designed for imaging, material characterization and nanoscale manipulation. VEECO Dimension 3100 S-1 combines the highest resolution imaging performance of the latest scanning probe microscopy (SPM) technology with advanced data acquisition, analysis and manipulation capabilities. DIGITAL INSTRUMENTS DIMENSION 3100 S 1 supports multiple scanning probes including contact and non-contact modes, enabling users to acquire atomic resolution images of a variety of surface details. The probe can be changed automatically or manually, offering users the flexibility to work with different probes or materials. In addition, Dimension 3100 S-1 supports several imaging modes such as tapping, Oscillation, Lateral Force and Force Modulation, allowing users to customize the imaging process to best suit their application. The intuitive GUI with the powerful software suite enables users to quickly and easily set up scanning parameters, conduct real-time image capturing and generate comprehensive image analysis data. It supports various tools for managing dynamic images including Line, Dual Line and Spatial Autocorrelation. The advanced software also allows users to zoom in on small features as well as use algorithms for fully automated analysis and manipulation of the images. DIGITAL INSTRUMENTS Dimension 3100 S-1 NanoMechanical Tester (NMT) is ideal for characterizing microscopic objects. It can measure both static and dynamic forces at the nanometer scale and accurately measure the elastic properties of a sample while maintaining high resolution imaging. The NMT is capable of nanoscale nanotribology and stiction measurements, making it easy to measure contact force, friction and adhesion forces. VEECO DIMENSION 3100 S 1 is designed with robust, reliable hardware including embedded vibration and noise isolation, making it suitable for even the most demanding applications. It is a highly refined AFM with a thickness of only 8.3 inches and a weight of 35 lbs, making it easy to transport and set up in any lab setting. DIMENSION 3100 S 1 from DIGITAL INSTRUMENTS is a powerful SPM tool for imaging, characterization and manipulation of nanostructures. It is highly flexible and enables users to customize imaging parameters for each application. In addition, it is energy efficient and provides superior resolution for imaging and material characterization at the nanometer level.