Used VEECO / DIGITAL INSTRUMENTS Dimension 3100 S-1 #9194106 for sale

VEECO / DIGITAL INSTRUMENTS Dimension 3100 S-1 is a scanning tunneling microscope (STM) capable of operating in either constant current or constant height modes. This instrument is used to examine surface morphologies, nanoscale electrical conductivity and topographical features, and other properties of materials and structures. VEECO Dimension 3100 S-1 features a large field of view, with the capability to image up to 200nm in size with a crystal-clear resolution of 1.3pm. A digital camera port allows for imaging documents on the microscope. A micrograph of the surface can be viewed on the built-in color LCD display. The microscope is equipped with an optical controller and joystick for ease of movement when manipulating the x, y, and z axis. This allows for the precise motion needed for accurate nanoscale features examination and measurement. In the constant current mode, the STM produces images and measures tunneling current with vertical and lateral resolutions of 0.6 nm. The microscope is capable of performing topographical measurements automatically by setting a constant contact force. The Z motions (z-piezo) can be adjusted up to 100µm. The instrument allows for fully automated measurements by including an integrated control system. The system is software-controlled, and supports a variety of STM, scanning electron microscopy (SEM), atomic force microscopy (AFM) and other imaging techniques. DIGITAL INSTRUMENTS DIMENSION 3100 S 1 is designed to meet the needs of the mechanical engineering, physics, and materials science communities. The microscope is suitable for measuring local electrical properties of surfaces, high sensitivity imaging, electric field enhancement, tunneling current measurement, and lithography. It is also used for investigating nanostructures, as well as for surface characterization studies. Dimension 3100 S-1 is a powerful and easy to use scanning tunneling microscope. It is capable of performing precise measurements and imaging with high resolutions, both in height and current modes. This instrument is suitable for a wide range of applications in physics, surface science, and materials research.