Used VEECO / DIGITAL INSTRUMENTS Dimension 3100 #293585800 for sale

ID: 293585800
Vintage: 2003
Atomic Force Microscope (AFM) 2003 vintage.
VEECO / DIGITAL INSTRUMENTS Dimension 3100 is a high-performance scanning probe microscope (SPM). It is well-suited for a variety of topographical, electrical, and material characterization applications in a wide range of industries. VEECO Dimension 3100 utilizes high-resolution, quantitative data acquisition and imaging capabilities by combining SPM, contact mode imaging and AFM (atomic force microscopy), in addition to incorporating repeatable drift correction, along with high speed curved scan methods. This yields high-resolution images and real time display capabilities for a range of materials, including organic and inorganic substances. The instrument features a large sample size range from 250 to 5000µm, a large range of scan rate speeds from 0.1 to 150 µm/s, and vacuum compatibility up to 10-10 bar. This provides improved analysis capabilities whilst maintaining a high level of accuracy. In addition, DIGITAL INSTRUMENTS Dimension 3100 provides improved imaging and data acquisition speeds along with enhanced sensitivity. The microscope is capable of acquiring data on any type of sample, including semiconductors and life sciences samples, due to its simultaneous medium and high vacuum mode capability. Furthermore, the microscope also features friction inversion, which allows for detailed images of surfaces that have higher topographical variations, such as steps or grooves, enabling the characterisation of samples down to the nanoscale. It also offers an automated scanning mode, which enables the user to scan samples in a reproducible manner, amd a simple probe exchange system, which allows the user to switch between different probe tips quickly and easily. In terms of customization, Dimension 3100 incorporates two software languages: the traditional Win32 application programming interface, which is easy to learn and modify, and a new open-source scripting language, allowing users to develop custom measurement scripts independently. Finally, the instrument also includes a variety of accessories, such as a vacuum chuck, temperature controllers, and a long-term drift correction device, which allows users to further enhance the capability of the tool to tailor it to their specific needs. Overall, VEECO / DIGITAL INSTRUMENTS Dimension 3100 is a powerful, multifunctional scanning probe microscope, designed to provide high-resolution imaging and quantitative data acquisition for a wide range of materials. It incorporates a range of features, such as friction inversion and an automated scanning mode, along with fast scan speeds and a simple probe exchange system, providing users with the ability to accurately characterise and analyse a variety of samples.
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