Used VEECO / DIGITAL INSTRUMENTS Dimension 3100 #293586981 for sale
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ID: 293586981
Atomic Force Microscope (AFM)
TFT, 19"
Vacuum chuck
DTR Torsional resonance mode
VT-103-3K-2 Integrated acoustic / Vibration isolation enclosure
NanoScope IVA SPM Control station:
Quadrex Extender electronics with on-board lock-in amplifier
Q-Control
High-speed DSP and SPM computer interface electronics
(6) Analog-to-digital converters
(4) Digital-to-analog converters
Dual monitor color display resolution: 32-Bit, 2048 x 768 pixels
(3) Scanning axes resolution: 16-Bit
Operating system: Windows XP
CE Compliant
Oscillator reference signal:
Line sync (End-of-line)
Frame sync (End-of-frame)
Quadrex Lock-in
Scanning probe microscope:
Samples: Up to 200 mm diameter and 12 mm thick
Magnetic sample holder included for samples less than 15mm diameter and 6mm thick
TrakScan Laser tracking system
Inspectable area: 120 mm x 100 mm
Stage resolution: 2 µm
Vacuum pump
Silicone vibration pad
Motorized optical focus:
Range: 285x - 1285x
Viewing area: 150 µm - 675 µm
Resolution: 1.5 µm
Computer control LED illuminator
Scanning tunneling
Force modulation (air and fluid)
Tapping mode (fluid) microscopy
Nano indenting / Scratching, scanning thermal microscopy
Scanning capacitance microscopy
Repeatability:
Unidirectional: 3 µm (typical), 10 µm (maximum)
Bidirectional: 4 µm (X-axis) and 6 µm (Y-axis), typical
Dimension Hybrid XYZ SPM Microscope head:
Ultra low noise 3-axis closed loop scanner
Scanner
Horizontal imaging area: 90 µm x 90 µm (Nominal maximum)
Vertical range: 9 µm (Nominal), 8 µm (Nominal minimum) in imaging mode
Tip holder
TrakScan Optical lever position detection system
VT-102 Vibration isolation table:
Base with (4) air suspension columns
Required air pressure: 0.8 bar
Minimum door diameter: 70 cm
Size: 610 mm x 610 mm x 787 mm.
VEECO / DIGITAL INSTRUMENTS Dimension 3100 is a high-powered, versatile and reliable scanning electron microscope (SEM). Designed for for scientific and industrial research, this state-of-the-art microscope is used to obtain accurate and detailed images and information about the physical, chemical, structural and electrical properties of a sample. The system features an energy dispersive X-ray (EDX) detector and an improved variable pressure specimen chamber. The EDX detector enables measurements of the elemental composition of a sample, while the variable pressure chamber improves user efficiency and flexibility by allowing sample tests to be conducted without the need for evacuation. VEECO Dimension 3100 features both dualbeam and analytical SEM modes, providing users with a range of capabilities and analysis options. Dualbeam mode includes a focused ion beam (FIB) detector that allows precise alteration of a sample structure as well as imaging of buried features. The system's analytical SEM mode provides accurate structural, compositional and dimensional characterizations, thanks to its advanced yet user-friendly imaging software. The system also includes an impressive selection of accessories, such as backscatter electron (BSE) detectors, cryostage systems, nanoscope stages and wide range ion beam detectors. These accessories enable detailed dynamic analysis and 3D imaging of samples. The sturdiness and reliability of DIGITAL INSTRUMENTS Dimension 3100 make it an ideal instrument for a variety of applications, from materials research and quality control to semiconductor device development. With its superior imaging capabilities, integrated software and versatile accessories, Dimension 3100 is a reliable and user-friendly tool for scientific and industrial research.
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