Used VEECO / DIGITAL INSTRUMENTS Dimension 3100 #293595294 for sale

VEECO / DIGITAL INSTRUMENTS Dimension 3100 is a scanning electron microscope (SEM) designed for advanced imaging applications. It combines its large 25.4 mm sample chamber with a wide range of detection packages, providing advanced imaging capabilities. The instrument features an easy-to-use graphical interface with a dedicated front panel that allows researchers to control all necessary parameters. VEECO Dimension 3100 features a large magnetic charged coupled device (CCD) imaging detection area of 6.2 cm2, with a 1280 × 1024 pixel resolution and wide range of imaging modes from low-voltage SEM to high-voltage topographic and electron backscattered diffraction (EBSD) imaging. Its large sample chamber has a capacity for up to 11 sample cells and a variable chamber pressure ranging from 0.1 mbar to 0.6 mbar. The instrument also offers a choice of 4 imaging detectors; a filtered backscattered secondary electron (BSE) detector, an in-lens secondary electron (SE) detector, a high-energy BSE detector, and a back-focused nEDXSD detector. The BSE detector features a rapid image acquisition rate of up to 30 frames per second and a very low noise level, providing high contrast and sharp definition of imaging features. The in-lens SE detector is designed to produce high-resolution cathodoluminescence images and diffraction patterns, allowing the user to control the spectrum and brightness of the emitted light. The nEDXSD detector provides real-time elemental information with a detection time of less than a minute and an extended range of detectable elements of up to 20%. DIGITAL INSTRUMENTS Dimension 3100 is also equipped with a third-generation EBSD system that allows for fast and accurate indexing of diffraction patterns of polycrystalline materials. This system also allows for angle map pattern classification, detailed characterization of grain boundaries, and automated analysis of crystal orientation. In addition, the instrument includes a fully integrated automated sample transfer stage which allows for the convenient and safe transport of specimens from the laboratory to the SEM. In conclusion, Dimension 3100 is an advanced scan electron microscope that offers a wide range of capabilities for enhanced imaging applications. It provides a large sample chamber, multiple imaging detectors and a convenient automated sample transfer stage, allowing researchers to quickly and easily obtain high-resolution imaging results.