Used VEECO / DIGITAL INSTRUMENTS Dimension 3100 #293605773 for sale

ID: 293605773
Atomic Force Microscope (AFM).
VEECO / DIGITAL INSTRUMENTS Dimension 3100 is a state-of-the-art scanning electron microscope (SEM) and a powerful microscopic imaging tool. The microscope offers users a high resolution, and highly detailed images of surfaces and surfaces down to the atomic level. The microscope is suitable for research applications in a range of disciplines and industries, including materials science, semiconductor engineering, and forensics. VEECO Dimension 3100 SEM has a variable working distance between 5mm and 16 mm and an accelerating voltage range from 40V up to 30KV. The field emission electron gun and in-column single pole lens equipment provide high resolution imaging. The microscope also features a digital image processor capable of capturing images at 6,000x magnification and resolutions of up to 5 nm. The high resolution imaging allows for particle analysis, microstructure characterization, defect detection, chemical analysis and 3D imaging. The chemical analysis includes EDS analysis and a computer-controlled, fully automated EDS program for automated qualitative and quantitative chemical analysis from energy dispersive X-ray spectroscopy. The 3D imaging capabilities enable detailed 3D structural analysis of sample surfaces, along with surface topography imaging. DIGITAL INSTRUMENTS Dimension 3100 SEM also has an optional high-resolution large area STEM imaging system. This unit is ideal for the imaging and analysis of large areas and complete sample volumes, for instance for the analysis of microelectronic components and surfaces. In addition, the microscope is equipped with an electron backscatter diffraction machine, which allows for the full-field study of crystallographic samples structures. The user interface is intuitive and easy to use, and can be used via the touchscreen LCD panel or a connected computer. The tool also offers advanced graphics capabilities, and the image can be evaluated through the on-screen display, or can be exported to third-party software for further analysis. In conclusion, Dimension 3100 SEM is an advanced imaging tool that offers high resolution imaging and analysis capabilities, with a wide range of features. The intuitive user interface, advanced graphics capabilities and optional large area STEM imaging asset make it an ideal choice for a range of applications.
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