Used VEECO / DIGITAL INSTRUMENTS Dimension 3100 #293633028 for sale

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ID: 293633028
Atomic Force Microscope (AFM).
VEECO / DIGITAL INSTRUMENTS Dimension 3100 is a high performance scanning probe microscope (SPM) designed specifically for nanoscale research. It is ideal for nanotechnology and materials science applications, allowing researchers to image and analyze samples at the nanoscale level. VEECO Dimension 3100 comes with a powerful software package, allowing users to prepare samples, acquire images and analyze data. It features a motorized X-Y scanner and a motorized Z-piezo, the two components needed to acquire the variety of high-resolution images. The X-Y scanner provides a control range of 8 mm x 8 mm, and the impedance matching piezo an accuracy of 0.1 nanometers in Z. For imaging and analyzing samples, DIGITAL INSTRUMENTS Dimension 3100 provides different imaging modes. These include contact mode, non-contact mode and tapping mode. Contact mode is used for imaging hard materials, non-contact mode for imaging soft surfaces, and tapping mode for measuring mechanical properties of materials. In addition, Dimension 3100 has options such as confocal mode and Kelvin probe force microscopy for further analytical possibilities. The optomechanical system of VEECO / DIGITAL INSTRUMENTS Dimension 3100 also provides users with excellent sample handling capabilities. It features an automated focus, stigmator controls, and a stage controller with an integrated drive system. The focus control is motorized and can be set with an accuracy of 0.1 nanometers. The stigmator controls allow the user to quickly adjust the xz and yz tilt of the sample while maintaining an optimal focus. The stage controller enables the user to fine tune the sample orientation with respect to the Z-direction. VEECO Dimension 3100 also has a wide variety of objectives. These objectives range from 50x to 1000x and provide researchers with excellent resolution. The variable magnification and objective lenses ensure that the best image is always acquired for each type of sample. The objectives are also compatible with a wide range of analysers, such as spectroscopy, photovoltaic analysis, Kelvin Probe Force Microscopy, nanolithography and more. Overall, DIGITAL INSTRUMENTS Dimension 3100 is an incredibly advanced and powerful scanning probe microscope that offers researchers an excellent level of image quality, resolution, and analytical capabilities. It is the ideal tool for exploring materials at the nanoscale, giving researchers the chance to observe and measure properties that would have previously been impossible.
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