Used VEECO / DIGITAL INSTRUMENTS Dimension 3100 #293658621 for sale
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ID: 293658621
Atomic Force Microscope (AFM)
NanoScope IlIa SPM System
AFM Controller
Surface analysis.
VEECO / DIGITAL INSTRUMENTS Dimension 3100 is a versatile scanning electron microscope (SEM) for imaging and analysis of a wide range of materials and microstructures. The microscope is designed to produce high-resolution images of samples such as metals, polymers, biomaterials, and nanomaterials. It combines advanced technologies such as energy-dispersive x-ray (EDS) analysis, electron backscatter diffraction (EBSD), and cathodoluminescence (CL) for high-resolution imaging. This advanced tool is capable of producing images with resolution up to 1 nanometer, and allows for quick and accurate evaluation of 3D features as well as morphology and defects in semiconductor and other nanoscale materials. The microscopes unique features include robotics-based sample handling and navigation, advanced data processing, sample screening, and automated feature listing. The microscope's 15kV power source is capable of delivering high-resolution images of various samples and material. It also features a high-performance embedded computer with advanced software programs and wide-ranging neuron network capabilities, as well as automated controls for focus performance, spot size adjustment, and image magnification. Additionally, the microscope offers high-speed EDS analysis with resolutions down to 50 eV for accurate elemental alternatives, as well as accurate EBSD measurements and CL analysis. VEECO Dimension 3100 also includes a number of other accessories to further optimize its performance. These include a wide variety of detectors, automation components, specimens holders, beam blanking devices, and control knobs. The microscope is also capable of handling various environmental conditions and can work under temperatures ranging from -20 and 60°C, as well as relative humidities up to 85%. Thanks to its combination of features, DIGITAL INSTRUMENTS Dimension 3100 was designed to enable scientists and researchers to explore and image modern materials and microstructures with unprecedented speed, accuracy, and precision. Its high resolution and automated features eliminate manual intervention and minimize the time required for sample analysis, making it an ideal tool for the quantification of microscopy data used in research and industry.
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