Used VEECO / DIGITAL INSTRUMENTS Dimension 3100 #293759126 for sale

VEECO / DIGITAL INSTRUMENTS Dimension 3100
ID: 293759126
Vintage: 1994
Atomic Force Microscope (AFM) 147G Head DMLS Laser 1994 vintage.
VEECO / DIGITAL INSTRUMENTS Dimension 3100 is an advanced scanning electron microscope (SEM) specifically designed to provide an accurate three-dimensional view of materials and surfaces. VEECO Dimension 3100 features an electron beam with a maximum emission current of up to 1 Amp, which is capable of resolving features down to a minimum of 0.1 nanometres. Its working distance is adjustable from 5 to 50 millimetres depending on the type of specimen being examined, ensuring high resolution images over a wide range of scales. The equipment also includes an imaging electron detector, which can detect secondary electrons and backscattered electrons, providing an increasing depth of field and contrast. Additionally, it is equipped with a scalable automation system which supports a wide range of sample preparation and loading techniques, including direct loading and thin-film processes. DIGITAL INSTRUMENTS Dimension 3100 also features a high-resolution chamber which accommodates a variety of chambers, including cryo-electron tanks for extremely low temperatures, and low noise modes for vibration-free imaging. Further, it is compatible with a selection of high-end detectors and accessories, allowing for even greater accuracy. The unit offers a range of imaging capabilities, including ultra high vacuum and standard vacuum systems, as well as a range of noise levels, from very good to +10 dB. Furthermore, a tiltable stage allows for low-magnification visual inspection of specimens before and after imaging. Finally, Dimension 3100 is equipped with a graphical user interface which enables users to load, control and analyze all components of the machine and control the microscope's motion parameters, giving users the flexibility to set up their experiments quickly and efficiently. Therefore, VEECO / DIGITAL INSTRUMENTS Dimension 3100 is a highly-accurate and versatile scanning electron microscope, offering a wide range of imaging capabilities and easy-to-use user interface. The tool's superior resolution, accuracy and automation capabilities make it an ideal choice for a range of microscopy applications.
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