Used VEECO / DIGITAL INSTRUMENTS Dimension 3100 #293765675 for sale

ID: 293765675
Atomic Force Microscope (AFM).
VEECO / DIGITAL INSTRUMENTS Dimension 3100 Scanning Probe Microscope is an advanced, multi-functional atomic force microscope (AFM) designed for nanoscale studies and measurements. It is a versatile tool for characterizing nanostructures such as nanoparticles, nanowires, polymers, proteins and DNA. The scanning probe microscope features a cantilever and a motorized scanner with powerful, nano-scale accuracy and sensitivity. The 3100 model features a motorized x-y scanner for imaging and working with nanostructures and surfaces, providing advanced resolution and high speed. The x-y scanner is controlled through the SmartScan software, providing capabilities such as z-piezo calibration, adjusting the scan-speed, and controlling the scan size and shape. It is ideal for applications such as imaging and measuring nanosurfaces, characterizing strain distribution in a nanostructure, detecting nanostructure defects, and imaging and measuring nanostructures suspended over a substrate. The 3100 scanning probe microscope is also capable of force modulation and spectroscopy. This provides the ability to measure local elastic constants on the surface of a sample or explore the tip-sample interaction potential. Additionally, the microscope is equipped to perform force-distance curves, measure nanoscale adhesion forces, and study complex physical phenomena such as friction, electronic and optical force microscopy. VEECO Dimension 3100 is a multi-functional AFM, combining highly reliable closed loop piezoelectric constant force actuators with the optical laser interferometer. This provides superior positional stability and accuracy, ensuring reliable and reproducible results. The microscope also includes high bandwidth actuators, allowing fast scanning rates with minimum drift and noise. The 3100 microscope's control unit is integrated with a 12" LCD touch-screen interface and a graphic user-friendly data analysis software. This allows users to record, analyze and store images quickly and accurately. The data management capabilities of DIGITAL INSTRUMENTS Dimension 3100 are further enhanced by the integrated PC and SmartScan software, making data storage and management easy and efficient. Dimension 3100 scanning probe microscope is a powerful tool for exploring nanoscale studies and measurements. Its motorized x-y scanner, high bandwidth actuators and interferential control unit allow for accurate, reliable and reproducible measurements. Furthermore, the integrated data management software simplifies data storage, analysis and management.
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