Used VEECO / DIGITAL INSTRUMENTS Dimension 3100 #293765965 for sale
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VEECO / DIGITAL INSTRUMENTS Dimension 3100 is a scanning probe microscope designed to operate at the nanoscale. This powerful instrument is used in research, analysis and material characterization. It has both atomic force microscopy (AFM) and scanning tunneling microscopy (STM) capabilities and is capable of high-resolution imaging of sample surfaces on the nanometer scale. VEECO Dimension 3100 offers an excellent combination of imaging and analytical capabilities. It has a robust closed-loop XY and Z sample scanner, allowing for accurate and adjustable tip-sample scanning. The sample is automatically and accurately positioned using a motorized flexure-based stage. A high-resolution image is generated using the automated tip-scanning sequences and STM/AFM imaging modes. The microscope is equipped with Z height sensing technology to measure the electrical characteristics of a sample in 3D, allowing for high-precision surface characterization. It features thermal scanning, automated scan pattern optimization and a variety of image filtering options. It also includes the "TRACK" feature, which allows for automated tip tracking. This feature provides an automated approach to locating, imaging and stepper tracing nanostructures on a sample's surface with minimal user intervention. DIGITAL INSTRUMENTS Dimension 3100 is equipped with a variety of environmental control modules such as a gas flow line module and a pressure control module, allowing for measurements in both gas and liquid environments. In addition, the microscope is also capable of dual channel operation with two independent channels which can be simultaneously operated at the same time. The microscope is supported by Windows-based software which provides data acquisition, image processing and analysis tools. The Windows-based software allows for fast data acquisition setup and image analysis. The user can analyze image data with built-in functions such as phase imaging, shape recognition, and lateral forces. Moreover, Dimension 3100 is equipped with a variety of accessories to facilitate sample preparation, scanning and characterization. It can be used to characterize a variety of materials such as semiconductors, polymeric and organic materials, biomaterials, proteins, DNA and other biomolecules. This versatile microscope is highly suited for use in research, analysis and characterization of materials on the nanoscale.
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