Used VEECO / DIGITAL INSTRUMENTS Dimension 3100 #293766072 for sale

VEECO / DIGITAL INSTRUMENTS Dimension 3100 is a profilometer/atomic force microscope (AFM) manufactured by VEECO. It combines profilometry with nanomanipulation and imaging technologies, enabling advanced micro- and nanoscale analysis and manipulation of samples. VEECO Dimension 3100 is a fully integrated platform, featuring high-resolution optical imaging and accurate profiling. The 3100 offers the ability to measure and analyze a variety of materials at the atomic, molecular, and nanoscale level. DIGITAL INSTRUMENTS Dimension 3100 is a scanning tunneling/atomic force/AFM microscope that offers users the ability to measure, manipulate and analyze a wide range of samples. It utilizes a multi-mode scanning technique, allowing for measurements to be taken at different levels of precision and versatility. This microscope is equipped with a digital camera, zoom lenses, and laser scanning stages, which enable both vertical imaging and atomic force measurements. It also has a multifunctional photorecording system, allowing for imaging in real time and storing images for future reference. The 3100 employs a 3-dimensional scanning technology for accurate measuring and visualizing the nano-level properties of any material. The main feature in this system is the scanning tunneling microscope, which is used to measure tiny features and establish atomic level force between different materials. This makes it capable of measuring both physical and material characteristics at high precision, down to a resolution of 0.1 nanometer. The 3100 is also equipped with a nanomanipulator that enables users to accurately manipulate samples, such as removing particles or nanoframes, in order to measure nanoscale features. It has a user-friendly interface and the ability to program a specific range of sample settings and parameters. In addition, the 3100 is equipped with a variety of image processing software, which allows for pre- and post-processing of measurement images. This provides an efficient solution for any sample analysis and manipulation. Finally, its integrated system also offers flexibility, allowing it to be used with a wide range of AFM and STM accessories, making it a versatile device for both surface and nano-level sample analysis.