Used VEECO / DIGITAL INSTRUMENTS Dimension 3100 #293779056 for sale

VEECO / DIGITAL INSTRUMENTS Dimension 3100 scanning/tunneling microscope is a multi-purpose tool for nanometer-scale imaging and metrology. This instrument combines scanning tunneling microscopy (STM) and atomic force microscopy (AFM) to provide detailed topographic analysis and measurement of surfaces with a lateral resolution of 0.3 to 0.5 nanometers and a vertical resolution of 0.1 nanometers. The 3100 is designed to measure a wide range of sample materials including metals, semiconductors, plastics, insulators, lubricants, and biological samples. The 3100 is equipped with a powerful image processing and analysis system, enabling the measurement and visualization of topography, nanoscale characteristics, and material properties. The instrument has dedicated software modules for multi-dimensional imaging, surface profiling, vector analysis, and measurement of critical dimensions, materials parameters, and electrical properties. It also features automated imaging, auto-focus, and automated specimen positioning and scanning. The software included with the 3100 provides an intuitive graphical environment for data visualization and analysis. The high resolution imaging mode includes automatic image alignment, correction of optical distortion, data capture and archiving capabilities, and the ability to save the images in common formats for further analysis or presentation. An advanced feature detection system allows for various types of tasks, such as surface analysis, pattern recognition, and dimensional accuracy. The software also has powerful automation and analysis capabilities, allowing users to develop custom-designed image processing menus for a variety of metrology applications. The 3100 scanning/tunneling microscope is easy to operate and maintain, enabling comprehensive and accurate measurements. The instrument has an ergonomic design, adjustable microscope stand, and a user-friendly control interface. The 3100 is a powerful tool for various research and industrial applications, including surface analysis, materials evaluation, process monitoring, IC design, and failure analysis.