Used VEECO / DIGITAL INSTRUMENTS Dimension 3100 #9112667 for sale

VEECO / DIGITAL INSTRUMENTS Dimension 3100 is a scanning electron microscope (SEM) capable of capturing a variety of samples in high detail at magnifications up to 300,000 times. It uses a low-voltage, cold field-emission electron source to generate a highly reliable beam for imaging and spectroscopy applications. VEECO Dimension 3100 offers flexibility in its operation due to the automated systems that guide and control the imaging. The sample is mounted to a stage and automatically moved by the X, Y, and Z scan motors that provide precise control of the sample position. Additionally, the XY positioning stage will facilitate sample vertical lift, making it easy to move the sample as needed. DIGITAL INSTRUMENTS Dimension 3100's software settings can be adjusted to optimize the scanning parameters and perform real-time image monitoring and acquisition. The camera has high resolution, with 2048 x 2048 pixels at 0.1 μm per pixel. The microscope is coupled with a detector control system that allows the user to control all aspects of the detection, such as defining the angular range, the energy pass-band, and the deflectors' gain. The system can be equipped with process-specific detectors such as the EDS detector for elemental analysis and the CL detector for crystal structure analysis. All of this combines to make Dimension 3100 an efficient tool for nanometer-scale imaging, analysis and characterization. The dimensions of this microscope are 295 x 92 x 325 cm with a maximum operating height of 24 cm . VEECO / DIGITAL INSTRUMENTS Dimension 3100 comes equipped with a variety of accessories designed to enhance its performance. These include the SEFE attachment to focus the electron beam, the sample exchange system for quickly switching between samples, and the cryo-stage for performing low temperature sample analyses. The microscope can also be equipped with an energy dispersive X-ray (EDX) spectrometer, which allows for elemental composition analysis of the sample. With VEECO Dimension 3100, the user can acquire high-quality SEM images, acquire both EBSD (Electron Backscattered Diffraction) and EDX data, and perform EDX-based elemental analysis. It is a powerful tool both for nanoscale research and industrial processes. With its automation and user-friendliness, DIGITAL INSTRUMENTS Dimension 3100 is the ideal microscope for any SEM application.