Used VEECO / DIGITAL INSTRUMENTS Dimension 3100 #9203566 for sale

VEECO / DIGITAL INSTRUMENTS Dimension 3100 is a tool for advanced nanoscale metrology and characterization. It is a computer-controlled scanning probe microscope that provides both high quality imaging capabilities and in-depth analytical capabilities. The 3100 has an advanced scanning tunneling microscope (STM), an atomic force microscope (AFM), a magnetic force microscope (MFM), and a combination of environmental modes, as well as secondary electron imaging (SEI). The STM portion of VEECO Dimension 3100 enables users to image features down to 0.1 nm, which allows for the observation of individual atoms and bonds. The STM also allows for in situ manipulation of sample surfaces. This feature makes it possible to test catalytic reactions, move particles and check the integrity at various stages of reaction. This can be useful for research in fields such as microelectronics, nanofabrication, and drug development. The AFM part of the 3100 is designed to accurately measure the physical properties of a sample, such as surface roughness, slip angle, and friction. It does this by scanning the sample surface with a specialized probe and interpreting the information collected. Users can also measure force-distance curves on the sample, which are important for measuring the mechanical and electrical properties of a material. The MFM provides static and dynamic feedback on ferromagnetic materials. It uses a combination of Lorentz force and magnetic force to measure properties such as magnetocrystalline anisotropy and domain wall mobility. The MFM component of DIGITAL INSTRUMENTS Dimension 3100 enables the characterization of magnetic thin films and other nanoscale sensor designs. The environmental mode of Dimension 3100 makes it possible to study materials under different conditions, such as temperature and pressure. This feature can be especially helpful in research focusing on semiconductor fabrication, since it allows users to study the effects of reaction temperatures, as well as other environmental effects, on manufacturing processes. Finally, the SEI component of VEECO / DIGITAL INSTRUMENTS Dimension 3100 allows for imaging of specimen surfaces at higher magnifications. This enables users to view and analyze grain boundaries, interfaces, and bumps on the sample. SEI is useful for research on thin films, nanomaterials, and other related fields. In conclusion, VEECO Dimension 3100 provides a powerful, multifunctional tool for nanoscale metrology and characterization. It combines scanning tunneling microscope, atomic force microscope, magnetic force microscope, environmental mode, and secondary electron imaging to deliver a comprehensive package of features to users. It is an ideal choice for researchers in the fields of microelectronics, nanofabrication, and drug development.