Used VEECO / DIGITAL INSTRUMENTS Dimension 3100 #9227547 for sale

VEECO / DIGITAL INSTRUMENTS Dimension 3100 Scanning Probe Microscope (SPM) is a research-grade microscope that enables imaging, mapping and analysis of objects too small to be seen with traditional optical microscopes. This advanced tool uses piezoelectric cantilevers to detect position changes on the nanometer scale for both 2D and 3D measurements. VEECO Dimension 3100 microscope is widely used by scientists and researchers in academia, industry and government to study nanoscale structures, such as proteins, polymers, semiconductors and nanowire. DIGITAL INSTRUMENTS Dimension 3100 microscope includes several components, such as a tiny cantilever and a high resolution sCMOS camera. The cantilever is made of a piezoelectric material, which expands or contracts in response to an electric field. The cantilever is mounted to the microscope's scanning head, which maneuvers the cantilever over a sample located on a pre-positioned microschip. The cantilever's tip has the sensitivity to detect small nanometer changes in the sample. The sCMOS camera, meanwhile, is paired with the microscope's optics to capture these changes and transfer them to a computer for further analysis. The System's SPM subsystem features proprietary feedback algorithms and a sensor module to regulate the cantilevered sample detector. Furthermore, the System is capable of scanning areas as small as 0.1nm and creating full-color images with resolutions up to 100nm. With the software's Image Management Module, it is also easy to store, organize and access all captured images. Dimension 3100 microscope offers a full suite of automation modes and data analysis tools, including combination mode for Stage Scan Analysis and Contact Frequency Spectrum for dynamic samples. This SPM is engineered to extract highly accurate information, even on surfaces that are rough, uneven and in three dimensions. VEECO / DIGITAL INSTRUMENTS Dimension 3100 is adjustable and reliable and can be calibrated to accommodate many different samples and applications. It can be modified to include colder stages, adding to its versatility in studying materials at temperatures lower than those achievable with other SPM designs. Overall, VEECO Dimension 3100 Scanning Probe Microscope is an incredibly powerful research tool, enabling scientists to get accurate and detailed nanoscale information about their sample materials. With its highly sensitive cantilever, high resolution camera and suite of automation and data analysis tools, it provides an invaluable resource for those researching nanoscale phenomena.