Used VEECO / DIGITAL INSTRUMENTS Dimension 3100 #9241953 for sale

VEECO / DIGITAL INSTRUMENTS Dimension 3100 is a scanning electron microscope (SEM), designed for scanning a wide range of specimens, including polymers and semiconductor materials. It is able to provide a variety of images with a high level of detail. The equipment features a robust design, which includes a fully-integrated EnCase platform with an ergonomic design that provides an easy-to-use and intuitive user experience. It is able to accommodate specimens in the range of 30 mm by 20 mm to 500 mm by 400 mm. It has a sample stage that can be manipulated to tilt the sample in order to achieve different imaging angles. It is also equipped with a highly sensitive secondary electron imaging detector and a cross-sectional mode that allows for imaging of thicker samples. The system also contains a field-emission gun which is designed to provide a high signal-to-noise ratio, low drift, and superior depth of focus. In addition, VEECO Dimension 3100 is equipped with a high-performance gaseous schottky scanner, which enables extremely detailed imaging of samples. The unit also features an illuminated optical viewing head which is used to facilitate sample positioning and preparation. The optical viewing head can be equipped with a variety of lenses, including a high-resolution 50x lens, allowing for analysis of small features. DIGITAL INSTRUMENTS Dimension 3100 can be used to generate and analyze a variety of image types. These include topographical images and backscatter images of the sample surface, as well as secondary electron images, which are used for imaging and analysis of critical feature surfaces. In addition, it is able to generate high-resolution images of large specimens, providing an accurate representation of the sample. The machine is also capable of automatically generating 3D models of the sample using the integrated software package. These models can be used to visualize and analyze the specimens in detail, as well as to create interactive 3D presentations of the sample. Overall, Dimension 3100 is a powerful and versatile scanning electron microscope which is capable of high resolution imaging and analysis of a wide variety of samples. It is designed to provide superior image quality and resolution with an intuitive and ergonomic user experience.