Used VEECO / DIGITAL INSTRUMENTS Dimension 3100V #9249374 for sale

VEECO / DIGITAL INSTRUMENTS Dimension 3100V
ID: 9249374
Atomic Force Microscope (AFM).
VEECO / DIGITAL INSTRUMENTS Dimension 3100V is a high performance scanning probe microscope particularly designed for in-depth analysis of samples in a variety of fields. The microscope provides a next-generation scanning system that helps the user to acquire high resolution data from a wide range of samples and areas. The 3100V utilizes both atomic force and optical microscopy techniques allowing users to access features and sub-micron details of samples. A tip scan range of up to 100nm, an extreme high signal-to-noise ratio and high-efficiency optics allow for acquiring high quality data from often inaccessible areas. VEECO Dimension 3100V features a large dynamic range of scan resolutions, from a few nanometers up to tens of microns. This helps to capture and analyze very fine detail when examining surfaces and materials. Additionally, the flexibility of the system and its high speed scanning imaging ability helps to capture many samples in a single experiment and acquire improved results over traditional microscopy methods. The 3100V includes multiple modes and many different component accessories for optimizing the user experience. It is equipped with an integrated SEM stage with a motorized X-Y-Z controller to support multiple microscope techniques. Additionally, a wide selection of probes, including liquid cell holders and tiltable optics gives the user the ability to customize the instrument to the individual sample they're studying. The 3100V is an all-in-one instrument designed to provide high-contrast images and accurate data. High-quality data is provided through the full range of automated scanning, and acquisition mode automation, capturing images quickly and accurately. Its high speed scanning and automated operation creates a high throughput system for industrial applications. In conclusion, DIGITAL INSTRUMENTS Dimension 3100V is a highly advanced microscope that provides users with the ability to acquire data from inaccessible areas. Through its motorized X-Y-Z controller and multiple modes and component accessories, this microscope enables the user to customize it to their individual needs. The 3100V also facilitates a high-speed scanning process which gives the user high-contrast images, accurate data, and high throughput capabilities that are optimal for industrial applications.
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