Used VEECO / DIGITAL INSTRUMENTS Dimension AFP #293766989 for sale

VEECO / DIGITAL INSTRUMENTS Dimension AFP is an atomic force microscope designed for nanometer-scale precision imaging and measurements of biological and non-biological objects. This advanced microscope is capable of three-dimensional (3D) imaging and topographic measurements of surfaces, as well as nanoscale mechanical and electrical property characterization. VEECO Dimension AFP utilizes a rapidly scanning piezoelectric transducer to maintain a constant force between the sample structure and the sensor cantilever. The cantilever transmits a nanometer-level displacement signal to the controller, which is used to generate the image and profile heigts. The AFP offers a variety of modes for measuring the nanostructure of a sample, including conductive AFM, force curve imaging (FCI), and alternative scanning modes such as power spectrum analysis and nanoparticle tracking. These modes allow the user to understand the nanostructure of a sample in unprecedented detail and to perform quantitative measurements such as material hardness and elasticity modulus. The AFP is equipped with an ultra-high resolution optical system that generates images with a resolution up to 0.5 nanometers, allowing users to distinguish the atomic gradients in a sample. Furthermore, the AFP is equipped with a variety of probes that span from small, general-purpose probes to large-sized probes to accommodate larger samples. The probes have been designed to maximize the performance of the AFP, with built-in shear, cantilever damping, and environmental protection mechanisms in order to capture an accurate image of the sample. Along with the probes, DIGITAL INSTRUMENTS Dimension AFP is equipped with a NanoVision Software Suite which allows users to capture and analyze images and curves. Overall, Dimension AFP is an advanced atomic force microscope that is capable of an array of applications, from biomedical imaging to MEMS characterization. This microscope provides researchers with a reliable and powerful tool for obtaining detailed nanoscale information about a sample, allowing them to visualize the nanostructure in unprecedented detail and perform quantitative measurements.