Used VEECO / DIGITAL INSTRUMENTS Dimension V #293610275 for sale

VEECO / DIGITAL INSTRUMENTS Dimension V
ID: 293610275
Atomic Force Profiler (AFP) Nanoscope V controller.
VEECO / DIGITAL INSTRUMENTS Dimension V is a versatile scanning-tunneling microscope (STM) designed for research and industrial applications. VEECO Dimension V provides high-resolution imaging and active-sample-mapping capability for submicron and nanometer-scale studies in research and industrial materials. DIGITAL INSTRUMENTS Dimension V utilizes a variety of technologies to create images of samples at up to 0.09 nm resolution. These include atomic-force microscopy (AFM), near-field scanning optical microscopy(NSOM), and tunneling spectroscopy. The multifrequency imaging feature of this scanning tunneling microscope allows the user to observe a variety of sample properties. Dimension V utilizes an interferometric detection system for STM images, similar to its predecessor, the Dimension III. An integrated charge-coupled detector (CCD) allows for larger field-of-view imaging than conventional scanning tunneling microscopes. The microscope's manipulators enable the user to apply forces, tilt, and rotate samples with precision. It also features a multi-frequency controller for fast, accurate imaging of different types of materials. Additionally, the microscope can measure surface topographies, force-distance curves, and dielectric properties — all with clarity and precision. VEECO / DIGITAL INSTRUMENTS Dimension V features a selection of automated routines for sample manipulation and data acquisition. Visual feedback of sample manipulation and scan results are displayed on the microscope's LCD display. Furthermore, process data can be stored on a computer to facilitate further analysis. Finally, VEECO Dimension V contains an easy-to-use graphical user interface (GUI) that allows users to quickly view, analyze, and manipulate images of samples. Additionally, DIGITAL INSTRUMENTS Dimension V is compatible with a variety of software including VEECO Portal and ImageJ. In conclusion, Dimension V is a highly versatile scanning tunneling microscope designed for industrial and research applications. It utilizes a variety of technologies to create images of samples at high resolution, with integrated manipulators for precise forces. VEECO / DIGITAL INSTRUMENTS Dimension V also features automated routines for sample manipulation, visual feedback on its LCD display, and a GUI for viewing, analyzing, and manipulating images.
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