Used VEECO / DIGITAL INSTRUMENTS Dimensions V 210 #9259792 for sale

ID: 9259792
Vintage: 2002
Atomic Force Profiler (AFP) 2002 vintage.
VEECO / DIGITAL INSTRUMENTS Dimensions V 210 is a microscope designed specifically for research-level metrology applications. This system enables users to accurately measure the properties of nanomaterials, including their electrical and optical properties. The system consists of a vacuum chamber, a monochromator, and a high resolution stage. The vacuum chamber helps to create a high vacuum environment in which the measurements can be more accurately taken. The monochromator allows for the selection of a single wavelength or wavelength range of light, which is then sent to the sample under investigation. The high-resolution stage allows for the precise positioning of the sample within the viewfinder. VEECO Dimensions V 210 offers high-resolution imaging capabilities, allowing for the analysis of intricate nanostructures. The user can switch between the optical microscope and the scanning electron microscope (SEM) mode, enabling them to make electrical measurements in both SEM and optical domains. The microscope offers very precise x, y, and z (depth) tracking of the sample, and features a digital signal processing (DSP) unit for more accurate measurements. This DSP unit also allows for proper waveform analysis of the measured signal. DIGITAL INSTRUMENTS Dimensions V 210 is equipped with a powerful PC-based interface, allowing the user to perform measurements via the intuitive software. This software not only helps the user perform a variety of measurements, but also offers a comprehensive range of data analysis tools. The software also features a built-in graphical user interface (GUI) for quickly setting up and visualizing measurements. Dimensions V 210 is an advanced research microscope designed to deliver accurate measurements in a wide variety of engineering and scientific applications. With a versatile design and powerful software, VEECO / DIGITAL INSTRUMENTS Dimensions V 210 offers a great tool for analyzing and characterizing nanostructures. Its comprehensive set of features make it ideal for testing and investigating electrical and optical properties of nanomaterials.
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