Used VEECO / DIGITAL INSTRUMENTS Multimode AFM-2 #9233893 for sale

VEECO / DIGITAL INSTRUMENTS Multimode AFM-2 microscope is a revolutionary imaging tool that brings the power of atomic force microscopy (AFM) to a wide range of industrial, scientific and research applications. With the AFM-2, users can analyze samples on a subnanometer scale through atomic-level imaging and analysis. This instrument is ideal for applications such as nanolithography and nanomanipulation, nanoelectronics, metrology, biotechnology, materials science, and more. The AFM-2 microscope is designed for high-resolution imaging and nanomechanical measurements. It features a built-in Digital InSight imaging system which allows for extremely accurate imaging, nanomanipulation, and quantitative analysis. The AFM-2 also has an automatic piezo scanner that makes scanning up to 10 MHz scan rates possible. Additionally, it features a high-resolution fingerprinting capacity that can provide unprecedented insight into nanomechanical properties of samples. It also has a highly precise XYZ adjustment of the force sensor that is studied through an angular range of up to 360°. To boost its versatility even further, VEECO Multimode AFM-2 also features three scan modes: contact mode, tapping mode, and dynamic force mode. In addition to these, the AFM-2 has several other features that include ultra-low drift operation, relative and absolute force calibration, damping control, and automatic drift correction. These features enable the successful operation of the microscope in a variety of conditions - from a wide range of temperatures, humidities, and acoustic environments. The AFM-2 is an incredibly versatile microscope, providing the user with the ability to perform multiple measurements and image acquisition tasks. It is available with a range of accessories to optimize user experiene, such as a motorized sample table, barcode reader, environmental monitoring, and a range of imaging stages. With the AFM-2 microscope, users can achieve unprecedented resolutions for imaging and nanoscale analysis applications.