Used VEECO / DIGITAL INSTRUMENTS Nanoscope III SPM / LSSF / DMLS #128345 for sale
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ID: 128345
Vintage: 1994
Atomic force microscope
Nanoscope III SPM and controller
LSSF large sample scanning stage with 6" x 6" XY travel
Optical microscope for defining the region to be scanned
Acoustic enclosure
DMLS probe
PC and monitors
1994 vintage.
VEECO / DIGITAL INSTRUMENTS Nanoscope III SPM / LSSF / DMLS is an innovative scanning probe microscope that uses advanced electron optics to allow for extremely precise imaging and profiling of surfaces. It is designed for high resolution imaging of samples that are too small to be seen by an optical microscope, and features a variety of imaging techniques for various applications. One of its main features is a large range of imaging modes which enable the analysis of a variety of surface features. Located at the heart of the system is the optical column, capable of scanning a sample in three dimensions. By utilizing laser interferometers, the column can be accurately positioned across the sample and is capable of imaging features as small as 25 nanometers in size. The Nanoscope III also features field emission scanning electron microscopy (FESEM) as well as surface stress and chip analysis (LSSF)capable of analyzing a sample's global surface stress and the kinetics of its material chips. Using this feature, researchers can gain an understanding of how a sample surface behaves in response to mechanical and environmental forces. Another of its features is differential dynamic microscopy (DMLS), which enables direct imaging of displacements associated with the surface waves of the sample. In addition to these features, the system also features automated feedback loops for restoring the focus automatically, making it easier to acquire repeatable repeatable images, and has an optional pre-scan mode that allows for real-time image acquisition. The Nanoscope III is a high performance microscopy system with a vast range of applications. It is well suited for imaging and analyzing small structures and determining their mechanical properties, analysis of surfaces and defects in thin films, as well as for extracting critical information for the development of new products. By combining powerful electron optics and analysis software, the Nanoscope III provides researchers with an instrument capable of delivering high precision images and measurement results that are essential for research science and engineering.
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