Used VEECO / DIGITAL INSTRUMENTS Nanoscope III #9276969 for sale

VEECO / DIGITAL INSTRUMENTS Nanoscope III is a high-precision scanning probe microscope technology that enables full-field nanoscale imaging and measurement. It features a multi-layer hard coating that makes use of environmental isolation and integrated optics to eliminate the effects of reflected light and produce sharper images. VEECO Nanoscope III combines scanning tunneling and atomic force microscopy (AFM) techniques to provide users with unprecedented resolution, accuracy, and reproducibility up to the nanometer level. Its MEMS design provides users with maximum flexibility by allowing the system to be reconfigured for specific applications, controlling the movement of the scanner in the X, Y, and Z axes. It also allows users to measure sample size, shape, and roughness with unprecedented accuracy. DIGITAL INSTRUMENTS Nanoscope III also comes with a variety of hardware and software options. This includes a multi-channel scanner for simultaneous imaging, a high-resolution display for easy viewing, and robotic motion control for high throughput operations. Nanoscope III is designed with a sensitive force-sensing system that has the ability to determine the force applied on a sample surface with extreme accuracy. This system is also designed to detect and measure changes in the sample surface's characteristics under varying thermal conditions. It can also measure the material's properties down to the atomic level. This allows users to characterize materials with extraordinary precision and detail. VEECO / DIGITAL INSTRUMENTS Nanoscope III is also manufactured with two distinct operation modes; Scanning Tunneling Microscopy (STM) and Atomic Force Microscopy (AFM). STM is utilized for imaging and characterizing surfaces with nanoscale features, while AFM is mainly used for measuring forces between the sample surface atoms. VEECO Nanoscope III also supports multiple operating modes including topographical mapping, force mapping, force spectroscopy, nanoindentation, and more. Equipped with automated thermal control, DIGITAL INSTRUMENTS Nanoscope III is capable of maintaining temperature stability up to 100 nm. This allows researchers to measure, image, and characterize the behaviour of material under extreme temperature conditions. Nanoscope III is designed to meet the unique demands of customers. Its exceptional design includes ergonomic frame construction, upgraded drive systems, and a host of advanced features that make it one of the top scanning probe microscopes on the market today. It is also compatible with a variety of electron microscope accessories and systems, allowing researchers to maximize their efficiency.