Used VEECO / DIGITAL INSTRUMENTS Nanoscope IIIa #9410550 for sale

VEECO / DIGITAL INSTRUMENTS Nanoscope IIIa is a high precision scanning probe microscopy platform designed for imaging and measuring surface structures on the nanoscale. It combines the latest technological advancements in electron microscopy with an intuitive software interface that allows users to custom configure the system to meet their application specific requirements. The instrument features several innovative technological advancements to ensure optimum performance. The proprietary 'flip-mode' positioning technology enables precise control over the scan head position and ensures exact registration between image data obtained in subsequent scans. Additionally, the advanced contrast-enhancing techniques allow users to obtain detailed, high contrast images and measure small feature sizes. The sample viewing module of VEECO Nanoscope IIIa is equipped with a 4 inch, 30 watt Lucite Light Source for maximum image resolution and contrast. The sample stage is 12" by 12" thus providing ample space for sample manipulation. Additionally, the sample holder can be employed for analysis of tilt angles, sample orientation and sample surface measurement. The data acquisition and resolution of DIGITAL INSTRUMENTS NANOSCOPE III A can be tailored to meet specific application requirements. A digital data acquisition with 16-bit resolution ensures accurate parameter measurements and allows users to customize scan speed for maximum resolution. Furthermore, a double beam of light for enhanced imaging is also available, providing increased contrast and image resolution. NANOSCOPE III A is a versatile instrument, suitable for a wide range of applications such as the study of nanoparticles, nanotubes, crystalline materials and high resolution characterization of semiconductor materials, to name a few. It is also compatible with a variety of accessories including touch-trigger probes, tweezers and scanning electron beam imaging. Based on the specific requirements and the sample type, the system can be configured to provide optimized imaging and measurement of structures as small as a few nanometers. With its advanced features, intuitive software interface and superior performance, VEECO / DIGITAL INSTRUMENTS NANOSCOPE III A offers superior performance for any scanning probe microscopy application.