Used VEECO Dimension 3000 SPM #9113918 for sale

VEECO Dimension 3000 SPM is a high-precision atomic force microscope (AFM) that combines groundbreaking performance and functionality with miniaturization, maximizing the user's flexibility and accuracy at the nanoscale. This microscope enables scientists and engineers to make confident measurements of nanoscale features not previously accessible. It is ideal for applications such as research of nanomaterials, nano-electronics, photonics and photovoltaic devices, as well as biotechnology research. The ultra-rugged construction of the Dimension 3000 ensures superior reliability and greater accuracy of measurements. It features an intelligent scan control system for precise position control and motion control. An innovative flexure feedback arm enables operation on rigid surfaces, including those with high step heights. This motion control system ensures accurate sample handling and control of the sample position while avoiding limb-induced artifacts. The superior scan implementations offer an extensive array of mode combinations. The high-performance positioning and imaging performance of Dimension 3000 SPM is derived from a combination of state-of-the-art design and construction. It features a modular open architecture, enabling the user to increase the complexity and functionality of the microscope, and the sample stage is linked to the AFM with a load bar. The associated electronics allow users to generate complex sample drives with small sectors and rapid tool change. Along with the AFM scanning abilities, the Dimension 3000 features an advanced M2 lens system with nanoaperture that allows for variable-mass imaging. This feature allows users to access the nanoscale with greater accuracy, by increasing the stability of the laser in the microscope while maintaining a very small interaction distance and a low degree of laser divergence. VEECO Dimension 3000 SPM also boasts a wide range of imaging modes and capabilities, from basic imaging to more advanced measurements, such as voltage-mode scanning and force spectroscopy. The Dimension 3000 provides considerable ease-of-use and comes factory calibrated. It offers a reliable and reliable measurement module, enabling users to accurately measure features in the nanoscale range with minimal effort. Additionally, the AFM's intuitive GUI adds ease of use and accessibility, and provides convenient management of acquired data. The data portability of the software enables sharing of complex datasets with colleagues and institutions worldwide. The combination of superior motion control and advanced imaging capabilities enable Dimension 3000 SPM to provide access to nanoscale features with unprecedented speed and accuracy.