Used VEECO Dimension Vx210 #9064761 for sale

VEECO Dimension Vx210 is a scanning electron microscope (SEM) that provides high-resolution analytical capability for a wide range of applications. It is designed to provide scientists and researchers with the information they need for advanced inference and defect analysis. Dimension Vx210 is equipped with a high-performance Tungsten filament field emission source for stable and reliable operation. This source produces a beam of electrons that is directed towards and focused on a sample located in a fully-equipped specimen chamber. To operate the microscope, researchers use its digital multi-axis stage. This allows users to accurately select and position the sample in 3D space, and to scan and measure across large areas of the sample. With its precision stage, users are able to achieve nanometer resolution and acquire images up to a maximum of 7nm in width. The system comes with a variety of add-on detectors to enable researchers to obtain a range of information from their samples. These detectors include a spectrum detector for energy dispersive spectroscopy (EDS), allowing users to identify the elemental composition of specimens quickly and accurately. The system also comes with a combined Cs corrected objective lens and re-collection side detector to provide all the information required for 3D surface topology and imaging. The lens delivers up to 30x multiplied magnification which is critical for identifying the surface features of small, complex specimens. VEECO Dimension Vx210 also features an Everhart-Thornley detector for Secondary Electron Imaging (SEI). This detector collects back-scattered and secondary electrons images, giving users the ability to accurately image and measure a wide range of specimen types, including nanoparticles and thin films. Finally, Dimension Vx210 comes with an ultra-high vacuum sample chamber. This chamber is designed to provide ultra-clean conditions so that the samples remain undisturbed while they are being observed and measured. This is essential for achieving repeatable results, and ensures that none of the specimens analyzed are contaminated. VEECO Dimension Vx210 scanning electron microscope is a powerful and versatile tool that is ideal for scientists and researchers looking for high-resolution analytical capabilities. With its combination of digital multi-axis stage, combined lens, and a range of detectors, the system provides users with a comprehensive range of features that makes it excellent for imaging and measuring even the most complex samples.