Used VEECO SXM 320 #36976 for sale

VEECO SXM 320
Manufacturer
VEECO
Model
SXM 320
ID: 36976
Atomic Force Microscope (AFM) Spare parts included.
VEECO SXM 320 scanning probe microscope is an advanced tool for studying surface morphology, measuring nanoscopic properties, and performing spectroscopy of materials. It offers outstanding optical and imaging performance, making it an excellent choice for analyzing nanoscale structures on the micro and nanometer scale. SXM 320 is a compact, fully automated microscope with a built-in motorized stage and programmable sample contact stages. It has a highly versatile micro- and nano-scale imaging system that features integrated top-and bottom-view optical, digital scanning, atomic force microscope (AFM), and atomic layer deposition (ALD) capabilities. The instrument can be configured with a wide range of accessories, including integrated optics and analytical components. VEECO SXM 320 supports four imaging modes: photomicrography, atomic force microscopy (AFM), scanning electron microscopy (SEM), and optical profilometry (OP). In addition, the instrument can be upgraded with additional software and hardware options, such as an automated sample preloader. SXM 320 allows users to capture, analyze, measure, and present a wide variety of nanometer-scale properties and phenomena. Its comprehensive imaging and analysis capabilities include micromachining, nanotechnology, spectroscopy, and imaging of surface morphology. This advanced nano-imaging instrument also has built-in remote login management, temperature control, and data acquisition and storage capabilities. VEECO SXM 320 offers exceptional performance when it comes to the resolution of its imaging capabilities - the images have a resolution of 0.3 nm and a field of view of up to 100 μm. The microscope is well-suited for nanoscale measurement applications, such as advanced imaging, AFM-based visualization, optical profilometry, and particle size measurement. It is also highly precise and precise with accuracies of 0.5 nm on a single pixel. SXM 320 scanning probe microscope is an advanced, state-of-the-art instrument that is designed to meet the needs of cutting-edge research, development, and industrial applications. Combining outstanding optical and imaging performance with cutting-edge microscopic capabilities, VEECO SXM 320 represents the perfect choice for studying and analyzing nanometer-scale properties and phenomena.
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