Used VEECO SXM Series #32497 for sale
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VEECO SXM Series is a scanning electron microscope designed for materials characterization. It is used to analyze nanoscale structures and nanomaterials. SXM Series microscope is a highly reliable and versatile tool for analyzing and characterizing nanoscale features and materials. VEECO SXM Series provides unique capabilities with the highest imaging resolution and finest details available today. SXM Series microscope is based on an environmental scanning electron microscope (ESEM) system. This system uses a combination of a high voltage electron column and an environmental chamber to create images. By utilizing a rapid scan function and specialized imaging techniques such as backscattering and low-kV imaging, researchers are able to study nanoscale features with remarkable detail. VEECO SXM Series microscope module has several unique features that make it an extremely powerful tool for nanomaterials characterization. First, the environmental scanning electron microscope comes with an ultra-stable gas source for creating a vacuum environment. This enables researchers to study nanostructures in virtually any atmosphere. Secondly, the instrument features a fast viewfinder system which displays up to 4 images simultaneously. SXM Series also comes with a high resolution camera and a high-speed CCD camera for imaging nanostructures with unparalleled detail. Lastly, VEECO SXM Series microscope has an automated physics package built in. This feature allows researchers to perform a variety of traditional analysis such as EDS and WDS analysis. This robust analysis package allows for a thorough and accurate analysis of any nanostructure. In summary, SXM Series is a highly reliable and feature-rich environmental scanning electron microscope suitable for the characterization of nanomaterials and nanostructures. Its flexible design and ultra-stable environment allow researchers to study materials in virtually any atmosphere. Advanced imaging and analysis capabilities make VEECO SXM Series an indispensable tool for nanomaterials research.
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