Used ZEISS Stemi SR #136284 for sale

ZEISS Stemi SR is a fully automated inverted microscope designed for convenience and efficiency during routine examination of a wide range of sample types. It features a versatile motorized stand with a liquid-cooled, short-arc xenon lamp excitation source that enables high-resolution imaging and quantitative analysis of samples under brightfield, phase contrast and fluorescence illumination. The motorized stand is capable of up to three sub-micron-precise axes of movement, allowing precise specimen positioning and precise examination of samples under a variety of conditions. The built-in 10x eye-piece also offers an additional level of convenience and flexibility for diagnosing and evaluating samples, allowing a wide range of specimen preparation options. Additionally, the optical system features a variety of objectives, which range from 3x to 100x magnification, and provide high-resolution images of samples in brightfield, darkfield, and phase contrast modes. The large field-of-view allows for ample scanning of the sample and precise inspection of large specimens. In order to perform quantitative analysis, Stemi SR is also equipped with a photometric image analysis program. This program allows users to analyze objects and morphometric parameters in brightfield and phase contrast images, as well as fluorescently labeled specimens. This system also provides high dynamic-range imaging, which allows users to accurately measure both dark and bright samples. The user-friendly interface and intuitive controls make the system suitable for non-specialists, and powerful enough for experienced users to extract accurate data from complex samples. Finally, ZEISS Stemi SR can be connected to PCs, allowing remote operation and data transfer from the microscope. The optional camera unit also enables users to capture high-resolution images of microscopy samples, allowing for digital and remote analysis of specimens. Stemi SR is intended for use in research labs, clinical and diagnostic settings, and other applications where precise examination of microscopy samples is necessary.